![]() Once a Magnum V is calibrated, the calibration tables match the customer device specific DSA’s that are loaded into the TIU. Testing these new, high-performance, high-density DRAM devices is optimized with FormFactor’s Matrix and PH-Series wafer probe cards as they improve efficiency and reduce the overall cost of DRAM test. The DSA TCALDX options are handler specific calibration units specifically designed for a customer selected TIU. Magnum V K52 interface provides a direct dock, tower-less connection to the probe card for lowest cost and maximum performance. The wafer sort SSV TIU can be swapped with any final test SSV TIU to provide for maximum flexibility in the production test environment. The SSV wafer sort TIU employs the K52 probe interface used on multiple Teradyne wafer sort system configurations. This eliminates the need for costly 3rd party motherboard/cable/socket board tooling. Magnum V TIU/DSA interface technology provides maximum signal performance with a single cable direct interconnect to the DSA (socket board). Handler specific TIU’s are available for multiple Techwing and Secron device handlers including TW322, TW-S7, TW350, and STH5600. The SSV and GV TIU’s interface 1.6Gbps digital channels to the handler DUT contactors. The array probe card is able to provide a very large number (>1000) of probe. Reconfigurable Instruments & Subsystemsįinal Test “Tester Interface Units” (TIU’s) A membrane probe card designed for high speed, high pin count testing was. The HFTAP K32 probe card solution empowers customers to gain more intelligence at any stage of the heterogeneous integration process for advanced packages, where the traditional way to optimize yield on a monolithic silicon die is no longer adequate."I am extremely proud of the ground-breaking performance we have achieved with this technology and look forward to becoming part of the PTSL team," added Boutaghou. Perfected over the years, it has allowed ThinkMEMS to demonstrate the highest performance signal integrity in the market today at frequencies over 100 GHz," stated Zine Boutaghou, CEO and founder of ThinkMEMS. "The ThinkMEMS technology is based on a highly innovative proprietary manufacturing process. By leveraging PTSL's market position, I am confident we can drive adoption of ThinkMEMS technology further into emerging markets," continued Mackellar. "PTSL will now offer an extremely differentiated competitive platform to our customers. The results demonstrate that the proposed technique is appropriate for evaluating the overall signal performance of probe cards with Automatic Test. The width and length of each probe is 90 m and 267 m. 1600 probes are arrayed in an area of 43 mm × 20 mm on the LTCC substrate. We see the acquisition as highly complementary to our existing Probe Card business and it will allow PTSL to address the adjacent high-frequency RF and fine pitch Probe-Card markets in a compelling way," said Jordan Mackellar CEO of PTSL. Figure 8 is the photographs of the fabricated probe card. ![]() " This acquisition follows quickly on our recently announced funding and supports our ambitious strategic growth plans. The terms of the transaction were not disclosed. ThinkMEMS solutions are already shipping in automotive radar test fixtures and other RF test applications of leading global test equipment OEMs. ![]() ThinkMEMS offers unique process IP, combining the fabrication of microdevices and assembly of complex structures to generate functional devices with unmatched repeatability and signal isolation at these frequencies. ThinkMEMS is a provider of high-performance contactors and antennas for RF test applications, enabling direct signal path mmWave testing at frequencies up to and beyond 120Ghz. 9, 2022 /PRNewswire/ - Probe Test Solutions Ltd (PTSL), headquartered in Glasgow Scotland, an established high-growth company and a world leader in delivering advanced ATE test hardware solutions, announces today that it has completed a transaction to acquire Dallas, Texas-based ThinkMEMS. Acquisition adds both high-frequency RF and fine-pitch technology to PTSL, enabling automotive radar and high-performance test applications. ![]()
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